A class of goodness of fit tests for a coupla based on bivariate right-censored data

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Standard

A class of goodness of fit tests for a coupla based on bivariate right-censored data. / Andersen, P.K.; Ekstrøm, C.T.; Klein, J.P.; Shu, Y.; Zhang, M.-J.

I: Biometrical Journal, Bind 47, Nr. 6, 2005, s. 815-824.

Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › fagfællebedømt

Harvard

Andersen, PK, Ekstrøm, CT, Klein, JP, Shu, Y & Zhang, M-J 2005, 'A class of goodness of fit tests for a coupla based on bivariate right-censored data', Biometrical Journal, bind 47, nr. 6, s. 815-824. https://doi.org/10.1002/bimj.200410163, https://doi.org/10.1002/bimj.200410163

APA

Andersen, P. K., Ekstrøm, C. T., Klein, J. P., Shu, Y., & Zhang, M-J. (2005). A class of goodness of fit tests for a coupla based on bivariate right-censored data. Biometrical Journal, 47(6), 815-824. https://doi.org/10.1002/bimj.200410163, https://doi.org/10.1002/bimj.200410163

Vancouver

Andersen PK, Ekstrøm CT, Klein JP, Shu Y, Zhang M-J. A class of goodness of fit tests for a coupla based on bivariate right-censored data. Biometrical Journal. 2005;47(6):815-824. https://doi.org/10.1002/bimj.200410163, https://doi.org/10.1002/bimj.200410163

Author

Andersen, P.K. ; Ekstrøm, C.T. ; Klein, J.P. ; Shu, Y. ; Zhang, M.-J. / A class of goodness of fit tests for a coupla based on bivariate right-censored data. I: Biometrical Journal. 2005 ; Bind 47, Nr. 6. s. 815-824.

Bibtex

@article{8ab8df60a1bf11ddb6ae000ea68e967b,
title = "A class of goodness of fit tests for a coupla based on bivariate right-censored data",
author = "P.K. Andersen and C.T. Ekstr{\o}m and J.P. Klein and Y. Shu and M.-J. Zhang",
year = "2005",
doi = "10.1002/bimj.200410163",
language = "English",
volume = "47",
pages = "815--824",
journal = "Biometrical Journal",
issn = "0323-3847",
publisher = "Wiley - V C H Verlag GmbH & Co. KGaA",
number = "6",

}

RIS

TY - JOUR

T1 - A class of goodness of fit tests for a coupla based on bivariate right-censored data

AU - Andersen, P.K.

AU - Ekstrøm, C.T.

AU - Klein, J.P.

AU - Shu, Y.

AU - Zhang, M.-J.

PY - 2005

Y1 - 2005

U2 - 10.1002/bimj.200410163

DO - 10.1002/bimj.200410163

M3 - Journal article

VL - 47

SP - 815

EP - 824

JO - Biometrical Journal

JF - Biometrical Journal

SN - 0323-3847

IS - 6

ER -

ID: 7985079